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This repository contains software for the calculation of goodness-of-fit test statistics and their P-values. The three statistics computed are the Empirical Distribution function statistics called Cramer-von Mises, Anderson-Darling, and Watson statistics. The statistics and their P-values can be used to assess an assumed distribution.The following distributions are available: Uniform, Normal, Gamma, Logistic, Laplace, Weibull, Extreme Value, and Exponential.
| Version: | 0.1.0 |
| Depends: | R (≥ 3.5.0) |
| Imports: | CompQuadForm (≥ 1.4.3), rmutil (≥ 1.1.5), stats |
| Suggests: | knitr, rmarkdown, stringi, testthat (≥ 3.0.0) |
| Published: | 2021-10-25 |
| Author: | Li Yao [aut, cre], Richard Lockhart [aut] |
| Maintainer: | Li Yao <yaoliy at sfu.ca> |
| BugReports: | https://github.com/LiYao-sfu/EDFtest/issues |
| License: | MIT + file LICENSE |
| NeedsCompilation: | no |
| Materials: | README NEWS |
| CRAN checks: | EDFtest results |
| Reference manual: | EDFtest.pdf |
| Vignettes: |
EDFtest-vignette |
| Package source: | EDFtest_0.1.0.tar.gz |
| Windows binaries: | r-devel: EDFtest_0.1.0.zip, r-release: EDFtest_0.1.0.zip, r-oldrel: EDFtest_0.1.0.zip |
| macOS binaries: | r-release (arm64): EDFtest_0.1.0.tgz, r-oldrel (arm64): EDFtest_0.1.0.tgz, r-release (x86_64): EDFtest_0.1.0.tgz, r-oldrel (x86_64): EDFtest_0.1.0.tgz |
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These binaries (installable software) and packages are in development.
They may not be fully stable and should be used with caution. We make no claims about them.