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Compares distributions with one another in terms of their fit to each sample in a dataset that contains multiple samples, as described in Joo, Aguinis, and Bradley (in press). Users can examine the fit of seven distributions per sample: pure power law, lognormal, exponential, power law with an exponential cutoff, normal, Poisson, and Weibull. Automation features allow the user to compare all distributions for all samples with a single command line, which creates a separate row containing results for each sample until the entire dataset has been analyzed.
| Version: | 1.0 |
| Depends: | R (≥ 3.1.1) |
| Imports: | VGAM, gsl, moments, utils, fitdistrplus |
| Published: | 2017-03-03 |
| DOI: | 10.32614/CRAN.package.Dpit |
| Author: | Harry Joo [aut, cre], Herman Aguinis [aut, dtc], Kyle J. Bradley [aut], Takuya Noguchi [ctb] |
| Maintainer: | Harry Joo <harryjoo19 at gmail.com> |
| License: | GPL-2 | GPL-3 [expanded from: GPL (≥ 2)] |
| NeedsCompilation: | no |
| Citation: | Dpit citation info |
| Materials: | README |
| CRAN checks: | Dpit results |
| Reference manual: | Dpit.pdf |
| Package source: | Dpit_1.0.tar.gz |
| Windows binaries: | r-devel: Dpit_1.0.zip, r-release: Dpit_1.0.zip, r-oldrel: Dpit_1.0.zip |
| macOS binaries: | r-release (arm64): Dpit_1.0.tgz, r-oldrel (arm64): Dpit_1.0.tgz, r-release (x86_64): Dpit_1.0.tgz, r-oldrel (x86_64): Dpit_1.0.tgz |
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These binaries (installable software) and packages are in development.
They may not be fully stable and should be used with caution. We make no claims about them.