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Set of functions for analyzing Atomic Force Microscope (AFM) force-distance curves. It allows to obtain the contact and unbinding points, perform the baseline correction, estimate the Young's modulus, fit up to two exponential decay function to a stress-relaxation / creep experiment, obtain adhesion energies. These operations can be done either over a single F-d curve or over a set of F-d curves in batch mode.
| Version: | 0.0.1 |
| Depends: | R (≥ 3.2.2), ggplot2 |
| Imports: | stats, utils, minpack.lm, grid, gridExtra, scales, dplyr, DBI, assertthat, tibble |
| Published: | 2017-04-03 |
| DOI: | 10.32614/CRAN.package.afmToolkit |
| Author: | Rafael Benitez, Vicente Jose Bolos, Jose-Luis Toca-Herrera |
| Maintainer: | Rafael Benitez <rabesua at uv.es> |
| License: | GPL-2 | GPL-3 [expanded from: GPL] |
| NeedsCompilation: | no |
| Materials: | README |
| CRAN checks: | afmToolkit results |
| Reference manual: | afmToolkit.pdf |
| Package source: | afmToolkit_0.0.1.tar.gz |
| Windows binaries: | r-devel: afmToolkit_0.0.1.zip, r-release: afmToolkit_0.0.1.zip, r-oldrel: afmToolkit_0.0.1.zip |
| macOS binaries: | r-release (arm64): afmToolkit_0.0.1.tgz, r-oldrel (arm64): afmToolkit_0.0.1.tgz, r-release (x86_64): afmToolkit_0.0.1.tgz, r-oldrel (x86_64): afmToolkit_0.0.1.tgz |
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These binaries (installable software) and packages are in development.
They may not be fully stable and should be used with caution. We make no claims about them.